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    Manas Kumar Parai

    About


    Designation: Research Scholar
    Degree: Ph. D.
    Fellowship: Sponsorship
    Enrollment No.: 362014AE2, Date: 30 Dec 2014
    Registration No.: PhD/R/2016/0017, Date: 03 Mar 2016Supervisor: Hafizur Rahaman
    Co-Supervisor: Kasturi Ghosh

    Academic Qualification

    • Pursuing PhD
    • M. Tech

    Research Area


    Topic: Fault Detection in Analog Circuits

    Research Area : Testing of Analog Circuits


    Skills


    Technical Skills : VHDL, Matlab, Spice Simulation, Implementation of Hardware Module to conduct lab Experiments

    Experimental Skills : Modeling of Faults, Designing ATG and Testing Method

    Presently working at : Siliguri Institute of Technology, Siliguri

    Work Experience : 10 years (Teaching), 1 year (Industry)


    Publications


    Journal :

    1. M. K. Parai, S. Srimani, K. Ghosh and H. Rahaman, “Analog Circuit Fault Detection by   Impulse Response-Based Signature Analysis," Circuits System & Signal Processing,   vol. 39, pp.   4281-4296, Feb. 2020
    2. S. Srimani, M. K. Parai, K. Ghosh and H. Rahaman, "Parametric fault detection of analog   circuits based on Bhattacharyya measure," Analog Integrated Circuits & Signal Processing, vol. 93,   pp. 477-488, Oct. 2017

     

    Conference :

    1. M. K. Parai, K. Ghosh and H. Rahaman, "Fault detection of continuous time filter using   nonlinear feedback based OBIST," in  Proceedings of the 6th International Conference on Computers   and Devices for Communication (CODEC), Kolkata, December 16-18, 2015, pp. 1-4
    2. S. Srimani, R. Singh, M. K. Parai, K. Ghosh and H. Rahaman, "Distortion Analysis Using   Volterra Kernel for Amplifier Circuits,"  IEEE International Symposium on Smart Electronic Systems   (iSES) (Formerly iNiS), Rourkela, India, December 16-18, 2019, pp. 308-311
    3. M. K. Parai, K. Ghosh and H. Rahaman, " Potentiality of Data Fusion in Analog Circuit Fault Diagnosis," 29 th IEEE Asian Test Symposium (ATS’20), Malaysia, November 22-25, 2020.
    4. M. K. Parai, K. Ghosh and H. Rahaman, " Potentiality of Data Fusion in Analog Circuit Fault Diagnosis," Indicon 2020, Delhi, December 11-13, 2020.