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Journal

# List of Publication by Dr. Surajit Kumar Roy
1 Dilip Kumar Maity, Surajit Kumar Roy and Chandan Giri, Identification of Random/Clustered TSV Defects in 3D IC during Pre-bond Testing, Accepted for publication in Journal of Electronic Testing:Theory and Applications (JETTA), Springer, 2019
2 Surajit Kumar Roy, Chandan Giri and HafizurRahaman, Optimization of Test Wrapper for TSV Based 3D SOCs, 32(5), 511-529, journal of Electronic Testing, 2016
3 Surajit Kumar Roy, Chandan Giri and Hafizur Rahaman, Optimization of Test Architecture in 3D Stacked ICs for Partial Stack/Complete Stack using Hard SOCs, 9(5), 268-274, Journal of IEEE Computer and Digital Techniques, 2015

Created: 23 November 2019